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- "Redefining Critical in Critical Dimension Metrology" , Proceedings of SPIE,
Vol. 4344, 815 (2001) Download pdf file (230kB) .
- "The Importance of Measurement Accuracy in Statistical Process Control" , Proceedings of SPIE,
Vol. 3998, 546 (2000). Download pdf file (85kB)
- MetroCal Brochure Download pdf file (17kB)
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